TO FIND THE THICKNESS OF THIN FILM (MICA SHEET) WITH THE HELP OF SPECTROMETER & MERCURY LIGHT SOURCE

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TO FIND THE THICKNESS OF THIN FILM (MICA SHEET) WITH THE HELP OF SPECTROMETER & MERCURY LIGHT SOURCE Specification

Type
Thin Film Thickness Measurement Apparatus

Material
Mica Sheet, Optical Metal, Glass

Size
Standard Laboratory Size

Input Voltage
Mercury Lamp: 220V AC, Spectrometer: Manual

Color
Grey/Black (Spectrometer), Silver (Mica Sheet), White (Mercury Light Source)

Dimension (L*W*H)
Spectrometer: Approx. 25cm x 15cm x 40cm; Mercury Lamp: Approx. 12cm x 12cm x 30cm

Capacity
Single Sample Measurement

Noise Level
Silent Operation

Safety Feature
Protective lamp cover and insulated cord

Standard Accessories
Mica sheet, spectrometer, mercury lamp, holder, mount

Light Source
High Intensity Mercury Vapor Lamp with holder and power cord

Calibration
Factory calibrated for direct measurement

Resolution
High precision angular reading up to 1 minute of arc

Application
Physics laboratory experiments on thin film interference and optical thickness

Measurement Range
Capable of measuring film thickness up to 0.01 mm to several mm

Weight
Spectrometer approx. 3.5 kg; Light source approx. 1.1 kg

Operating Principle
Interference-based measurement using monochromatic light

Included Items
Complete assembly as shown: spectrometer, mercury lamp, mica sheet sample

Spectrometer Type
Prism Spectrometer with scaled vernier and reading telescope

User Interface
Manual adjustment and visual observation

Compliance
Meets standard laboratory safety and accuracy requirements

About TO FIND THE THICKNESS OF THIN FILM (MICA SHEET) WITH THE HELP OF SPECTROMETER & MERCURY LIGHT SOURCE

Celebrate the monumental innovation of our Thin Film Thickness Measurement Apparatus, featuring a brilliant price cut and exceptional discount for laboratories across India. This highly recommended kit combines a precision prism spectrometer with a high-intensity mercury vapor lamp to confidently detect mica sheet thickness from 0.01 mm upwards. Renowned for its accuracy, silent operation, and factory calibration, this celebrated instrument is indispensable for academic experiments on thin film interference. Complete assembly, rapid setup, durable build, and strict safety compliance - a truly brilliant investment for physicists and institutions.

Directions, Advantages, and Who Uses It

To find the thickness of thin films such as mica sheets, simply place the sample in the spectrometer's mount and illuminate with the mercury vapor lamp. Adjust the instrument manually and observe interference patterns to obtain readings. This offers quick, direct measurement with high precision. Widely used by physics researchers, students, and laboratory professionals, the system is advantageous for studying optical phenomena and teaching practical physics concepts.

Packaging, Certifications, and Domestic Market

Order processing is efficient, with each kit securely packaged including all standard accessories. Our certified product meets recognized laboratory safety and accuracy standards, ensuring reliable performance. With offer-based pricing and options for quick dispatch, we serve the main domestic market across India, catering to educational institutions, exporters, distributors, and suppliers. Detailed packaging maintains component integrity during transit for a seamless delivery experience.

FAQ's of TO FIND THE THICKNESS OF THIN FILM (MICA SHEET) WITH THE HELP OF SPECTROMETER & MERCURY LIGHT SOURCE:

Q: How does the spectrometer measure thin film thickness using the mercury light source?

A: The spectrometer utilizes interference-based measurement, where monochromatic light from the mercury lamp passes through the thin film. By observing the resulting interference fringes, users can calculate the thickness of the mica sheet with high precision.

Q: What is the measurement range and resolution offered by this apparatus?

A: The system measures thin films with thicknesses ranging from 0.01 mm up to several millimeters, offering angular resolution up to one minute of arc for precise optical analysis.

Q: When should I calibrate the instrument before use?

A: The spectrometer comes factory calibrated for direct measurement, eliminating the need for initial calibration. It can be used straight out of the box, but periodic verification is recommended for sustained accuracy.

Q: Where is this apparatus most commonly used?

A: This thin film thickness measurement kit is mainly used in physics laboratories, universities, research facilities, and educational institutions for experiments related to optical interference and thin film properties.

Q: What are the process steps for operating the kit?

A: First, securely place the mica sheet sample onto the mount. Illuminate it with the mercury vapor lamp. Adjust the spectrometer manually, then visually observe and record the interference patterns for thickness analysis.

Q: What safety features are included with this apparatus?

A: The product is equipped with an insulated power cord and protective lamp cover to ensure user safety during operation, complying with standard laboratory safety requirements.

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